JF Test Socket Technology

EZ Contact

For Analog/RF/Wave Device Testing

The EZ Contact High Performance Test Contacting Solution designed and validated for initial lab characterization through high-volume production test environments. The EZ Contact technology is a proprietary short rigid contacting solution with a single multifunctional elastomer for biasing and controlling contact motion. EZ Contact technology encompasses the patented technology of SWS (Short Wiping Stroke) along with ACF (Advanced Contact Finishing) and TCC (Thermal Conditioning Channel) Technology to meet your most demanding High Performance Electrical and Mechanical Test Requirements. Product is easily integrated into most IC Handler platforms